Technical Tutorial:
"Next Generation Design and Verification Today"

Presented the Design and Verification Conference (DVCon) 2015, this tutorial shows how the community is applying the existing standards in novel ways by connecting them together to solve next-generation problems today.

Part 1: Requirements-driven Verification Methodology (for Standards Compliance)

Mike Bartley, TVS
View Presentation (38 min.)
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Part 2: Using UCIS to Combine Verification Data from Multiple Tools

Mike Bartley, TVS
View Presentation (8 min.)
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Part 3: UVM REG: Path Towards Coverage Automation in AMS Simulations

Kyle Newman, Texas Instruments
View Presentation (27 min.)
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Part 4: New Developments in UPF 3.0

Erich Marschner, Vice-Chair, IEEE P1801 WG
View Presentation (41 min.)
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Sponsored By

ARM Cadence
Intel Mentor Graphics
Synopsys